
September 19-21, 2017
The International Metrology Congress (CIM) will be back from 19 to 21 September
2017 in Paris to be devoted this year to measurement in industry. EA will
co-facilitate a round table focusing on measurement and declaration of
conformity under ISO/IEC 17025.
Alongside with
the ENOVA show, the 18th CIM will gather about 1 000 participants from 50
countries – among which end-users of measurement technology in industry and
laboratories, quality managers and decision makers, manufacturers of measuring
equipment, distributors and providers, academics and researchers – to improve
their knowledge of the technologies in measurement, explore industrial
challenges and discover the latest innovations.
This 3-day event
will include diversified conference and round table sessions, technical site
visits and demonstrations, as well as an exhibition showcasing innovations and
solutions.
Six round tables will enable direct and lively discussions on the following themes:
Further
information on round tables is available at http://www.cim2017.com/round-tables-cim-2017.html
As the co-facilitator of the round table on ISO/IEC 17025, Laurent Vinson is
stating that “both as Director of the Laboratory Division of COFRAC,
the French national accreditation body, and Chair of the EA Laboratory
Committee, I consider it is important for accreditation to be visible and
promoted within the Congress. Accreditation provides laboratories a sound,
internationally-accepted recognition of their technical competence. The new
version of ISO/IEC 17025 will reinforce the benefits for
accredited laboratories. I am happy to facilitate the discussions during the
round table with representatives of major interested parties, including ones
that have directly contributed to the revision of the standard at the ISO
level.”