September 19-21, 2017
The International Metrology Congress (CIM) will be back from 19 to 21 September 2017 in Paris to be devoted this year to measurement in industry. EA will co-facilitate a round table focusing on measurement and declaration of conformity under ISO/IEC 17025.
the ENOVA show, the 18th CIM will gather about 1 000 participants from 50
countries – among which end-users of measurement technology in industry and
laboratories, quality managers and decision makers, manufacturers of measuring
equipment, distributors and providers, academics and researchers – to improve
their knowledge of the technologies in measurement, explore industrial
challenges and discover the latest innovations.
This 3-day event
will include diversified conference and round table sessions, technical site
visits and demonstrations, as well as an exhibition showcasing innovations and
Six round tables will enable direct and lively discussions on the following themes:
information on round tables is available at http://www.cim2017.com/round-tables-cim-2017.html
As the co-facilitator of the round table on ISO/IEC 17025, Laurent Vinson is stating that “both as Director of the Laboratory Division of COFRAC, the French national accreditation body, and Chair of the EA Laboratory Committee, I consider it is important for accreditation to be visible and promoted within the Congress. Accreditation provides laboratories a sound, internationally-accepted recognition of their technical competence. The new version of ISO/IEC 17025 will reinforce the benefits for accredited laboratories. I am happy to facilitate the discussions during the round table with representatives of major interested parties, including ones that have directly contributed to the revision of the standard at the ISO level.”